Provides Atomic Force Microscope images analysis such as Power Spectrum Density, roughness against lengthscale, variogram and variance, fractal dimension and scale.
| Version: | 1.0.0 |
| Depends: | R (≥ 3.1.3) |
| Imports: | data.table (≥ 1.9.6), stringr (≥ 1.0.0), gstat (≥ 1.0-26), fractaldim (≥ 0.8-4), rgl (≥ 0.95.1337), pracma (≥ 1.8.6), fftwtools (≥ 0.9-7), geoR (≥ 1.7-5.1), grid (≥ 3.1.3), gridExtra (≥ 2.0.0), moments (≥ 0.14), ggplot2 (≥ 1.0.1), sp (≥ 1.2-0), png (≥ 0.1-7), plyr (≥ 1.8.3), methods (≥ 3.1.3) |
| Published: | 2015-10-29 |
| Author: | Mathieu Beauvais [aut, cre], Irma Liascukiene [aut], Jessem Landoulsi [aut] |
| Maintainer: | Mathieu Beauvais <beauvais.escp at gmail.com> |
| License: | AGPL-3 |
| NeedsCompilation: | no |
| CRAN checks: | AFM results |
| Reference manual: | AFM.pdf |
| Package source: | AFM_1.0.0.tar.gz |
| Windows binaries: | r-devel: AFM_1.0.0.zip, r-release: AFM_1.0.0.zip, r-oldrel: AFM_1.0.0.zip |
| OS X Snow Leopard binaries: | r-release: not available, r-oldrel: not available |
| OS X Mavericks binaries: | r-release: not available |