diffractometry: Baseline Identification and Peak Decomposition for x-Ray Diffractograms

Residual-based baseline identification and peak decomposition for x-ray diffractograms as introduced in Davies/Gather/Mergel/Meise/Mildenberger (2008) <doi:10.1214/08-AOAS181>.

Version: 0.1-10
Published: 2018-03-16
Author: P.L. Davies, U. Gather, M. Meise, D.Mergel, T. Mildenberger. Additional Code by T. Bernholt and T. Hofmeister
Maintainer: T. Mildenberger <mild at zhaw.ch>
License: GPL-2 | GPL-3 [expanded from: GPL (≥ 2)]
NeedsCompilation: yes
In views: ChemPhys
CRAN checks: diffractometry results


Reference manual: diffractometry.pdf
Package source: diffractometry_0.1-10.tar.gz
Windows binaries: r-devel: diffractometry_0.1-10.zip, r-release: diffractometry_0.1-10.zip, r-oldrel: diffractometry_0.1-10.zip
OS X binaries: r-release: diffractometry_0.1-10.tgz, r-oldrel: diffractometry_0.1-10.tgz
Old sources: diffractometry archive


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