Residual-based baseline identification and peak decomposition for x-ray diffractograms as introduced in Davies/Gather/Mergel/Meise/Mildenberger (2008) <doi:10.1214/08-AOAS181>.
| Version: | 0.1-10 |
| Published: | 2018-03-16 |
| Author: | P.L. Davies, U. Gather, M. Meise, D.Mergel, T. Mildenberger. Additional Code by T. Bernholt and T. Hofmeister |
| Maintainer: | T. Mildenberger <mild at zhaw.ch> |
| License: | GPL-2 | GPL-3 [expanded from: GPL (≥ 2)] |
| NeedsCompilation: | yes |
| In views: | ChemPhys |
| CRAN checks: | diffractometry results |
| Reference manual: | diffractometry.pdf |
| Package source: | diffractometry_0.1-10.tar.gz |
| Windows binaries: | r-devel: diffractometry_0.1-10.zip, r-release: diffractometry_0.1-10.zip, r-oldrel: diffractometry_0.1-10.zip |
| OS X binaries: | r-release: diffractometry_0.1-10.tgz, r-oldrel: diffractometry_0.1-10.tgz |
| Old sources: | diffractometry archive |
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