Provides tools for estimating composition and configuration parameters from a categorical (binary) landscape map (grid) and then simulates a selected number of statistically similar landscapes. Class-focused pattern metrics are computed for each simulated map to produce empirical distributions against which statistical comparisons can be made. The code permits the analysis of single maps or pairs of maps. Current limitation is for binary (classes 1, 2) maps that are 64x64 cells in extent.
| Version: | 2.0.0 |
| Depends: | R (≥ 3.5.0), landscapemetrics, raster |
| Published: | 2020-01-23 |
| Author: | Tarmo K. Remmel, (Marie-Josee Fortin, Ferenc Csillag, Sandor Kabos) |
| Maintainer: | Tarmo K. Remmel <remmelt at yorku.ca> |
| License: | GPL (≥ 3) |
| NeedsCompilation: | no |
| CRAN checks: | PatternClass results |
| Reference manual: | PatternClass.pdf |
| Package source: | PatternClass_2.0.0.tar.gz |
| Windows binaries: | r-devel: PatternClass_2.0.0.zip, r-devel-gcc8: PatternClass_2.0.0.zip, r-release: PatternClass_2.0.0.zip, r-oldrel: PatternClass_2.0.0.zip |
| OS X binaries: | r-release: PatternClass_2.0.0.tgz, r-oldrel: PatternClass_2.0.0.tgz |
| Old sources: | PatternClass archive |
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